Tuesday 27 March 2018 photo 23/30
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Metricon 2010/m manual: >> http://kzc.cloudz.pw/download?file=metricon+2010m+manual << (Download)
Metricon 2010/m manual: >> http://kzc.cloudz.pw/read?file=metricon+2010m+manual << (Read Online)
Technical details: “Metricon 2010" Prism coupler. • Simple measurement of optical refractive index. • Operating wavelengths: 532 nm, 632.8 nm, 1064 nm. • Refractive index resolution of ±.0005. • Light polarizations: TE and TM. • High accuracy index measurement of bulk, substrate, or liquid materials including birefringence/
The Metricon Model 2010/M Prism Coupler utilizes advanced optical waveguiding techniques to rapidly and accurately measure both the thickness and the refractive index/birefringence of dielectric and polymer films as well as refractive index of bulk materials. The 2010/M offers unique advantages over conventional
The Metricon Model 2010/M Prism Coupler utilizes advanced optical waveguiding techniques to rapidly and accurately measure both the thickness and the refractive index/birefringence of dielectric and polymer films. Our system is equipped with four different lasers at wavelength:449nm,633nm,963nm and 1540nm.
13 Jul 2015 Metricon representatives will be on campus on Monday, July 13th, to demonstrate their prism coupler unit and give a lecture on prism coupling theory. Additionally, CNF is hoping to gauge user interest as a new potential tool purchase. This travel tool setup can do index and thickness measurements only at
The 2010/M offers unique advantages over conventional refractometers and instruments based on ellipsometry or spectrophotometry.
According to the manufacturer: The Metricon Model 2010/M Prism Coupler utilizes advanced optical waveguiding techniques to rapidly and accurately hard drive has been upgraded) - Additional Prisms and misc. parts included (see photo) - All cables and power cords included (see photo) - The manual is included This
Compared to instruments based on optical interference, ellipsometry, or Abbe refractometry, the 2010/M's prism coupling technology provides unmatched index accuracy/resolution, and minimal sample preparation is required. The system also measures dispersion, index gradients, dn/dT, and loss of optical waveguides.
For all types of guides, the Model 2010/M provides rapid measurement of mode indices, and for step index guides, calculation of guide thickness and refractive index and, in most cases, substrate or cladding index. In addition, with the standard TE-mode measurement, indices for both guides and substrate materials are
3 Apr 2017 These procedures apply to the Metricon Model 2010/M Prism Coupler Bulk Material, Thick. Film Index/Birefringence/ Thickness Measurement System. All maintenance should follow the procedures set forth in the manufacturer's maintenance and operations manuals. This document is for reference only.
18 Mar 2015
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