o "System Handle" or "PIN" code. DEVICE IMAGE: Support Request Customer with "System Handle" or "PIN" code. DEVICE IMAGE: Product Catalog IC Test Systems. About ADVANTEST · CEO Message · The Advantest Way & Code of Conduct · Corporate Overview
SmarTest PG. Benefit: Program. Generation knows the tester configuration for which the patterns were generated. Directly loadable 93K. Test Program. CTL. STIL Pin Mapping. Manual. Data Entry. Data. Extraction. AWK. Script. EDA. Data. Extraction. Setups Cyclization. View Results and Adjust. Directly. Loadable. Output
Jan 30, 2015 Reducing the cost of test requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime for the greatest return on customers' capital investments. ADVANTEST's V93000. Smart Scale test platform is the semiconductor industry's first scalable, highly
Nov 27, 2012
Verigy V93000. HSM DDR3 64 sites. Memory Test System. Technical Specifications. CONTENTS. 1. System overview. 2. 2. Timing. 4. 2.1 Fast timing. 4. 2.2 STD Timing. 6. 3. Digital channels. 7. 3.1 FAST Driver. 7. 3.2 STD Driver. 8. 3.3 Programmable load. 9. 3.4 FAST receiver. 10. 3.5 STD receiver. 11. 4. Parametric
1.3 What Design-to-Test Tools are available? Velocity CAE for the Verigy 93000 offers the following Design-to-Test Tools: Tool. Description. WGLtoAVC. Converts patterns and timing from WGL (Waveform. Generation Language) files to Verigy's AVC and DVC format along with files needed for Verigy's ASCII translator.
A Block Based Test Methodology (BBTM) for Verigy 93K Platform. - Subbarao Jaldu, Cypress, sgj@cypress.com. - Albert Alcorn, Cypress, lka@cypress.com. 1. Silicon Valley Test Conference 2010. Presenters. Logo
Objectives of this Manual. The manual provides information about the properties of the specific test system hardware of the Agilent 93000. SOC Series. Audience. The manual is intended for engineers on the testfloor (test engineers, production engineers, manufacturing engi- neers). Scope of the Manual. The manual covers
This document presents guidelines to design a Device Under Test (DUT) Board. The DUT board is to be used with the Verigy (Agilent) 93000 Tester in the Advanced Digital Systems Lab. This document deals with digital applications only. Licensing Requirements or Restrictions. All CMC Microsystem account holders with a
Nov 12, 2017 V93000 High Speed Memory A Block Based Test Methodology (BBTM) for Verigy 93K Background : 93k Test Program Requirements. 6. Silicon Valley Test Standard char testfunctions. the specific test system hardware of the Agilent 93000 The manual is intended for engineers on the testfloor (test .

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March 2018