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This document presents guidelines to design a Device Under Test (DUT) Board. The DUT board is to be used with the Verigy (Agilent) 93000 Tester in the Advanced Digital Systems Lab. This document deals with digital applications only. Licensing Requirements or Restrictions. All CMC Microsystem account holders with a
Scope of the Manual. The manual covers feature-oriented reference material, capabilities, restrictions and other considerations regarding. • Test system components .. System Architecture The Agilent 93000 SOC Series testers combine highest Shielding the Signals The safest way to transport signals between analog.
The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF
Download >> Download Verigy 93000 manual transfer. Read Online >> Read Online Verigy 93000 manual transfer advantest v93000 manual verigy 93k tester manual pdf advantest 93k manual verigy 93k specifications verigy 93k training verigy 93k tutorial verigy 93k programming advantest 93k tester manual 1. Verigy
Teradyne A575. Parts Machine. Agilent/Verigy 93000 C400e. SOC Test System. Teradyne A585. Parts Machine. Agilent/Verigy 93000 C400e. SOC Test System. Teradyne J750. Digital Test System. Agilent/Verigy 93000 PS3600. SOC Test System. Teradyne J937. 50 Mhz Memory Test. Agilent/Verigy 93000 P600. SOC Test
Verigy V93000 SOC. Pin Scale 400. Digital Card. Technical Specifications. Rev 1.0.1 April 26. -2007. Note: The specifications are preliminary and are subject to change. Pin Scale 400 is a high density flexible digital Channel Card for the V93000 Platform to address the general transfer from and to the host computer.
1. Verigy V93000 Direct-Probe™. Evolution of the Verigy V93000 SOC Tester in Wafer Probing. Larry Dibattista, Daniel Lam. Verigy. Abstract. The increasing proliferation of multi-chip modules Prober in the V93000 Direct Probe Configuration. By conducting at . is transferred directly from the probe array to the prober.
Jul 14, 2010 Verigy Analyst Event. SEMICON/West, July 2010. Page 4. Agenda. ? Business Overview. Keith Barnes. 8:30 – 8:45. ? Customer & Market Dynamics Pascal Ronde. 8:45 – 8:55. ? New Markets. Jorge Titinger. 8:55 – 9:05. ? V93000 New Capabilities. Hans-Juergen Wagner. 9:05 – 9:20. ? Operating Model.
to transfer data to and from the external media such as hard disk, memory. There are V93000 clock architecture follows the coherent equation in both its PinScale system and the latest. SmarScale system .. implement the set of instructions to allow the link establishment and communicate to the tester to gener- ate pattern
Jan 30, 2015 Reducing the cost of test requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime for the greatest return on customers' capital investments. ADVANTEST's V93000. Smart Scale test platform is the semiconductor industry's first scalable, highly
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