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2-34 J750E-512 Pin Test System Service Reference Manual 3 Software Description The Software Description chapter of this manual provides an overview of the software and programming environment of the J750E tester. The following information is covered in this chapter: • Teradyne IG-XL Software • J750 Maintenance
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13 Jun 2012 An individual test instance is based on one of the four types: – Visual Basic “Test Template" supplied by Teradyne – Visual Basic “User Template" created by user – Visual Basic Macro created by user – C++ “User Program" created by user 26 J750 Test System Templates ? Test Templates: The most
21 Apr 2015 J750 Test System J750 PROGRAMMING V3.40 Training Manual Module 2 Test Program Overview PN 553-405-50 Rev - August 2002 J750 Programming - V3.4 Test Program Overview -1 J750
J750 Test System Tester Configuration Located: Program FilesTeradyneIG-XLTesterCurrentConfig.txt 20 . J750 Test System J750 Software Overview • Software Overview • Data Tool • Pattern Tools • Test Templates • Debug Displays • Production Controls 21 . 0 (Office 97) and later • Visual Basic 6.0 / Windows 95 and
Prepared by Dong (Hudson) An, Mixed-Signal Collaboratory Engineer, CMC Microsystems. The IG-XL® program is a software environment developed by Teradyne Inc. It is the user programming interface for the FLEX test family (including FLEX, microFLEX and UltraFLEX). This test program is constructed based on the
Teradyne's J750 platform is the industry standard for cost-effective test of a broad set of diverse microcontroller, FPGA and digital audio/baseband devices.
Maximizing J750 test cell capacity,. 2011-04-06. Lessons learned. Teradyne Users Group 2011. 2. Abstract. Test cost reduction will be achieved by maximizing the capacity of the test cell. Due to the variety of devices that need to be tested, a certain tester resource is always a blocking factor. This case study highlights the
J750 tester. 64 Channels per Board. 100 MHz. 512/1024 I/O Pins. 4 / 16 Meg Per Pin Vector. Memory with integrated Scan. Flexible Pattern and Timing. Architecture x32 True Parallel Test. Full suite of instruments: ?SCAN. ?Converter Test Option. ?Memory Test Option. ?High Voltage Drivers. ?Mixed Signal Option
4 Jul 2013
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