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Jesd 78 pdf: >> http://tfh.cloudz.pw/download?file=jesd+78+pdf << (Download)
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78D. Page 1. IC LATCH-UP TEST. (From JEDEC Board Ballots JCB-96-69, JCB-08-45, JCB-10-34 and JCB-11-81, formulated under the cognizance of JC-14.1 Committee on Reliability Test Methods for Packaged Devices.) 1. Scope. This standard covers the I-test and the overvoltage latch-up testing of integrated circuits.
8 Oct 1998 Replaced CDF-AEC-Q100-004 with the JEDEC IC Latch-up Test specification EIA/JESD78. •. Section 1.2, Class II Classification: AEC-Q100 latch-up testing shall be performed at the maximum ambient operating temperature. •. Section 1.3, Failure criteria: Device does not pass the test requirements of Table
JEDEC Standard No. 78A. Page 1. IC LATCH-UP TEST. (From JEDEC Board Ballot JCB-05-113, formulated under the cognizance of JC-14.1 Committee on Reliability. Test Methods for Packaged Devices.) 1. Scope. This specification covers the I-test and the overvoltage latch-up testing of integrated circuits. 1.1 Purpose.
7 Aug 2012 AEC - Q100-004 - REV-D. August 7, 2012. Component Technical Committee. Automotive Electronics Council. Change Notification. The following summary details the changes incorporated into AEC-Q100-004 Rev-D: •. Referenced the latest version of the JEDEC IC Latch-up Test specification JESD78.
JEDEC JESD78E. IC LATCH-UP TEST. standard by JEDEC Solid State Technology Association, 04/01/2016. View all product details. Most Recent. Track It. Language: English. Available Formats; Options; Availability; Priced From ( in USD ). PDF;; Immediate download; $74.00; Add to Cart. Printed Edition; Ships in 1-2
JEDEC. STANDARD. General Requirements for. Distributors of Commercial and. Military Semiconductor Devices. JESD31D. (Revision of JESD31C, September 78e. ______ Identification of the applicable documents (including revision levels)? (3.15-2). 79. ______ Does the training procedure require retraining when
JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by
It fully addresses today's JEDEC/ESDA standards, and can be configured with 64, 128, 192 or 256-pin test capabilities. • Waveform network: 8-site HBM pulse source. • Human Body Model (HBM) and. Machine Model (MM) testing to industry standards. • Static Latch-Up testing per current. JEDEC's EIA/JESD 78 method.
Latch-Up. Marty Johnson, Roger Cline, Scott Ward, Joe Schichl. ABSTRACT. This document describes and discusses the topic of CMOS Latch-Up ranging from theory to testing of products. The recently proposed modifications to JEDEC standard JESD78 are discussed along with progress for making it more analog friendly
ESD Protection Exceeds JESD 22. ? 200-V Machine Model (A115-A). ? 2000-V Human Body Model (A114-A). ? Exceeds 1000-V Charged Device Model (C101C). •. Latch-Up Exceeds 250mA per JESD 78, Class II . The taping orientation and tape details can be found at www.diodes.com/datasheets/ap02007.pdf
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