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J750 tester. 64 Channels per Board. 100 MHz. 512/1024 I/O Pins. 4 / 16 Meg Per Pin Vector. Memory with integrated Scan. Flexible Pattern and Timing. Architecture x32 True Parallel Test. Full suite of instruments: ?SCAN. ?Converter Test Option. ?Memory Test Option. ?High Voltage Drivers. ?Mixed Signal Option
J750 Test System Tester Configuration Located: Program FilesTeradyneIG-XLTesterCurrentConfig. J750 Test System J750 Software Overview • Software Overview • Data Tool • Pattern Tools • Test Templates • Debug Displays • Production Controls 21 . 0 / Windows 95 and later • Excel 8.J750 Test System Software
Prepared by Dong (Hudson) An, Mixed-Signal Collaboratory Engineer, CMC Microsystems. The IG-XL® program is a software environment developed by Teradyne Inc. It is the user programming interface for the FLEX test family (including FLEX, microFLEX and UltraFLEX). This test program is constructed based on the
21 Apr 2015 J750 Test System J750 PROGRAMMING V3.40 Training Manual Module 2 Test Program Overview PN 553-405-50 Rev - August 2002 J750 Programming - V3.4 Test Program Overview -1 J750
Maximizing J750 test cell capacity,. 2011-04-06. Lessons learned. Teradyne Users Group 2011. 2. Abstract. Test cost reduction will be achieved by maximizing the capacity of the test cell. Due to the variety of devices that need to be tested, a certain tester resource is always a blocking factor. This case study highlights the
Teradyne's J750 platform is the industry standard for cost-effective test of a broad set of diverse microcontroller, FPGA and digital audio/baseband devices.
J750 Programming - V3.4. PN 553-405-50 Rev - August 2002. J750 Test System. DUT to Tester Interface - 1. J750 PROGRAMMING. V3.40. Training Manual. Module 3. DUT to Tester Interface
Find the cheap Teradyne J750 Programming Manual, Find the best Teradyne J750 Programming Manual deals, Sourcing the right Teradyne J750 Programming Manual supplier can be time-consuming and difficult. Buying Request Hub makes it simple, with just a few steps: post a Buying Request and when it's approved,
2 May 2007 Teradyne J750 - A tester donated to ISU that is used for testing printed circuit boards and integrated . User has read and understood the Teradyne J750 instructional manual. • A suitable background in A test program will be developed for each of the devices using IG-XL and will allow new devices of
13 Jun 2012 An individual test instance is based on one of the four types: – Visual Basic “Test Template" supplied by Teradyne – Visual Basic “User Template" created by user – Visual Basic Macro created by user – C++ “User Program" created by user 26 J750 Test System Templates ? Test Templates: The most
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